Automated tests improve laser diode manufacturing

被引：0
|
作者：
Koenig, M
Hartmayer, R
Thiagarajan, P
Quinn, A
机构：
[1] Newport Corp, Irvine, CA 92714 USA
[2] Spectracom, White Bear Lake, MN 55110 USA
来源：
LASER FOCUS WORLD | 1998年 / 34卷 / 08期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Tougher laser diode requirements for WDM systems have led to a new generation of automated production test equipment.
引用
收藏
页码：191 / +
页数：6
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