Admittance spectroscopy of a phosphorus-doped n-diamond homoepitaxial layer

被引:2
|
作者
Koide, Y
Koizumi, S
Kanda, H
Suzuki, M
Yoshida, H
Sakuma, N
Ono, T
Sakai, T
机构
[1] NIMS, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan
[2] Toshiba Co Ltd, Corp Res & Dev Ctr, Saiwai Ku, Kawasaki, Kanagawa 2128582, Japan
关键词
diamond; admittance spectroscopy; phosphorus donor; deep dopant; debye tail; depletion layer;
D O I
10.1016/j.diamond.2005.08.006
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Generation and recombination processes of electrons through phosphorus (P) donor are analyzed by admittance spectroscopy for a Ni/Au Schottky contact oil an n-diamond epilayer. The dependence of capacitance and conductance frequency oil temperature is interpreted by Shockley-Read-Hall statistics. The thermal ionization energy and capture cross-section of P donor are evaluated to be 0.54 +/- 0.02 eV and (4.5 +/- 2.0) x 10(-17) cm(2), respectively. Broadening of the conductance-frequency curve is observed, which is believed to be evidence of a long Debye tail of electron distribution at the depletion layer edge, (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:2011 / 2014
页数:4
相关论文
共 50 条
  • [1] Enhancement of donor ionization in phosphorus-doped n-diamond
    Koide, Y
    APPLIED SURFACE SCIENCE, 2005, 244 (1-4) : 26 - 29
  • [2] Thick homoepitaxial (110)-oriented phosphorus-doped n-type diamond
    Balasubramaniam, Y.
    Pobedinskas, P.
    Janssens, S. D.
    Sakr, G.
    Jomard, F.
    Turner, S.
    Lu, Y. -G.
    Dexters, W.
    Soltani, A.
    Verbeeck, J.
    Barjon, J.
    Nesladek, M.
    Haenen, K.
    APPLIED PHYSICS LETTERS, 2016, 109 (06)
  • [3] Electrical characterization of phosphorus-doped n-type homoepitaxial diamond layers
    Suzuki, M
    Koizumi, S
    Katagiri, M
    Yoshida, H
    Sakuma, N
    Ono, T
    Sakai, T
    DIAMOND AND RELATED MATERIALS, 2004, 13 (11-12) : 2037 - 2040
  • [4] Admittance spectroscopy for phosphorus-doped n-type diamond epilayer -: art. no. 232105
    Koide, Y
    Koizumi, S
    Kanda, H
    Suzuki, M
    Yoshida, H
    Sakuma, N
    Ono, T
    Sakai, T
    APPLIED PHYSICS LETTERS, 2005, 86 (23) : 1 - 3
  • [5] Field emission characteristics of phosphorus-doped homoepitaxial diamond films
    Kimura, C
    Kuriyama, K
    Koizumi, S
    Kamo, M
    Sugino, T
    APPLIED SURFACE SCIENCE, 1999, 146 (1-4) : 295 - 298
  • [6] Cathodoluminescence of phosphorus-doped {111} homoepitaxial diamond thin films
    Sato, A
    Tanabe, K
    Egawa, S
    Tsubota, T
    Morooka, S
    Hojyo, J
    Maeda, H
    Kawarada, H
    NEW DIAMOND AND FRONTIER CARBON TECHNOLOGY, 1999, 9 (02): : 123 - 125
  • [7] Electron mobility in (100) homoepitaxial layers of phosphorus-doped diamond
    Stenger, I.
    Pinault-Thaury, M. -A.
    Temahuki, N.
    Gillet, R.
    Temgoua, S.
    Bensalah, H.
    Chikoidze, E.
    Dumont, Y.
    Barjon, J.
    JOURNAL OF APPLIED PHYSICS, 2021, 129 (10)
  • [8] Electron emission process of phosphorus-doped homoepitaxial diamond films
    Kimura, C
    Koizumi, S
    Kamo, M
    Sugino, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (02): : 1024 - 1026
  • [9] Attractive electron mobility in (113) n-type phosphorus-doped homoepitaxial diamond
    Pinault-Thaury, Marie-Amandine
    Stenger, Ingrid
    Gillet, Remi
    Temgoua, Solange
    Chikoidze, Ekaterina
    Dumont, Yves
    Jomard, Francois
    Kociniewski, Thierry
    Barjon, Julien
    CARBON, 2021, 175 : 254 - 258
  • [10] Strains and cracks in undoped and phosphorus-doped {111} homoepitaxial diamond films
    Tajani, A
    Mermoux, M
    Marcus, B
    Bustarret, E
    Gheeraert, E
    Koizumi, S
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 2003, 199 (01): : 87 - 91