Slightly off-axis flipping digital holography using a reflective grating

被引:3
|
作者
Bai, Hongyi [1 ,2 ,3 ]
Min, Rui [4 ]
Yang, Ziheng [1 ]
Zhu, Fuzhen [1 ]
机构
[1] Heilongjiang Univ, Coll Elect Engn, Harbin 150080, Heilongjiang, Peoples R China
[2] Heilongjiang Univ, Res Ctr Fiber Opt Sensing Technol Natl Local Join, Harbin 150080, Heilongjiang, Peoples R China
[3] Heilongjiang Univ, Res Ctr IOT Percept Layer & Sensor Network Engn, Harbin 150080, Heilongjiang, Peoples R China
[4] Univ Politecn Valencia, TEAM Res Inst, E-46022 Valencia, Spain
基金
中国国家自然科学基金;
关键词
digital holography; slightly off-axis; flipping interferometry; reflective grating; phase measurement; QUANTITATIVE-PHASE MICROSCOPY; FOURIER-TRANSFORM; DIFFRACTION; INTERFEROMETRY; COMPENSATION; SUPPRESSION; BANDWIDTH;
D O I
10.1088/2040-8986/ab6b85
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A slightly off-axis digital holography is proposed using the flipping interferometry with a reflective grating to obtain the quantitative phase distribution. The setup is established based on a modified 4f optical system using an improved flipping module with a reflective grating and a retro-reflector made of a two-mirror construction. The input plane of the system is divided into two windows: one for object beam and the other for reference beam. Employing the flipping module, the interference patterns can be obtained by flipping the images of the object and reference beams. By translating the +1 diffraction order of the reflective grating, two carrier holograms with a phase shift between them can be obtained in two exposures. The reconstructed quantitative phase distribution of a specimen can be acquired with a simple slightly off-axis retrieval method aided by specimen-free holograms. Many measurements on both thick and thin phase specimens are performed to prove the validity of our method.
引用
收藏
页数:12
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