Atomic Force Microscopy at ultrasonic frequencies

被引：0
|
作者：
Arnold, W [1 ]
Caron, A [1 ]
Hirsekorn, S [1 ]
Kopycinska-Müller, M [1 ]
Rabe, U [1 ]
Reinstädtler, M [1 ]
机构：
[1] Fraunhofer Inst Nondestruct Testing, D-66123 Saarbrucken, Germany
来源：
ACTIVE MATERIALS, NANOSCALE MATERIALS, COMPOSITES, GLASS AND FUNDAMENTALS | 2005年 / 14卷
关键词：
D O I：
暂无
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：1 / 11
页数：11
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