High-power room temperature emission quantum cascade lasers at a λ=9 μm

被引:28
|
作者
Faugeras, C [1 ]
Forget, S
Boer-Duchemin, E
Page, H
Bengloan, JY
Parillaud, O
Calligaro, M
Sirtori, C
Giovannini, M
Faist, K
机构
[1] Univ Paris 07, Pole Mat & Phenomenes Quant, F-75251 Paris, France
[2] Univ Paris 13, Phys Lasers Lab, F-93430 Villetaneuse, France
[3] Thales Res & Technol, F-91404 Orsay, France
[4] Univ Neuchatel, Inst Phys, CH-2000 Neuchatel, Switzerland
关键词
high power emission; InP based device; quantum cascade laser;
D O I
10.1109/JQE.2005.858797
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present two different techniques for processing InP-based lambda = 9 mu m quantum cascade lasers which improve the thermal dissipation in the device. The first process is based on hydrogen implantation creating an insulating layer to inject current selectively in one part of the active region. The second process uses a thick electroplated gold layer on the laser ridge to efficiently remove the heat produced in the active region. Each process is designed to improve heat evacuation leading to higher performances of the lasers and will be compared to a standard ridge structure from the same wafer. We give evidence that the process of proton implantation, efficient in GaAs based structures, is not directly aDplicable to InP based devices and we present a detailed analysis of the thermal properties of devices with an electroplated gold thick layer. With these lasers, an average power of 174 mW at a duty cycle of 40% has been measured at 10 degrees C.
引用
收藏
页码:1430 / 1438
页数:9
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