Using product test data for manufacturing process control

被引：0
|
作者：
Spitzlsperger, Gerhard [1 ]
Frick, Matthias [1 ]
Rathei, Dieter [2 ]
机构：
[1] Renesas Semicond Europe Landshut GmbH, Jenaer Str 1, D-84034 Landshut, Germany
[2] DR YIELD Software & Solut GmbH, A-8010 Graz, Austria
来源：
ISSM 2006 CONFERENCE PROCEEDINGS- 13TH INTERNATIONAL SYMPOSIUM ON SEMICONDUCTOR MANUFACTURING | 2006年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new software tool, YieldWatchDog (TM), for monitoring all electrical test parameters was evaluated. The scope of this tool is to control all electrical test parameters and to detect early warning signals for yield degradation. Although no yield degradation occurred during the evaluation time period, the usefulness of the tool could be demonstrated using historical data.
引用
收藏
页码：368 / +
页数：2
相关论文
共 50 条
  • [1] Early detection of a manufacturing problem using product test data
    Beutl, Michael
    Prossegger, Alexander
    Wawrina, Axel
    Rathei, Dieter
    [J]. 2008 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE, 2008, : 114 - +
  • [2] Using data mining methods for manufacturing process control
    Vazan, P.
    Janikova, D.
    Tanuska, P.
    Kebisek, M.
    Cervenanska, Z.
    [J]. IFAC PAPERSONLINE, 2017, 50 (01): : 6178 - 6183
  • [3] Product Quality Prediction using Alarm data : Application to the Semiconductor manufacturing process
    Melhem, Mariam
    Ananou, Bouchra
    Ouladsine, Mustapha
    Combal, Michel
    Pinaton, Jacques
    [J]. 2017 25TH MEDITERRANEAN CONFERENCE ON CONTROL AND AUTOMATION (MED), 2017, : 1332 - 1338
  • [4] Integrated Product and Process Control for Sustainable Semiconductor Manufacturing
    Chen Liang
    Huang, Yinlun
    [J]. CHINESE JOURNAL OF CHEMICAL ENGINEERING, 2011, 19 (02) : 192 - 198
  • [5] The Embedded Quality Control System of Product Manufacturing Process
    Du, Li
    Ke, Yun
    Su, Song
    [J]. ADVANCED RESEARCH ON INDUSTRY, INFORMATION SYSTEM AND MATERIAL ENGINEERING, 2012, 459 : 510 - +
  • [6] Analysis of Manufacturing Process Sequences, Using Machine Learning on Intermediate Product States (as Process Proxy Data)
    Wuest, Thorsten
    Irgens, Christopher
    Thoben, Klaus-Dieter
    [J]. ADVANCES IN PRODUCTION MANAGEMENT SYSTEMS: COMPETITIVE MANUFACTURING FOR INNOVATIVE PRODUCTS AND SERVICES, AMPS 2012, PT II, 2013, 398 : 1 - 8
  • [7] TOTAL MANUFACTURING PROCESS-CONTROL - THE HIGH ROAD TO PRODUCT CONTROL
    TUNNER, JR
    [J]. QUALITY PROGRESS, 1987, 20 (10) : 43 - 50
  • [8] Data mining algorithm for manufacturing process control
    Sadoyan, H
    Zakarian, A
    Mohanty, P
    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2006, 28 (3-4): : 342 - 350
  • [9] Data mining algorithm for manufacturing process control
    Hovhannes Sadoyan
    Armen Zakarian
    Pravansu Mohanty
    [J]. The International Journal of Advanced Manufacturing Technology, 2006, 28 : 342 - 350
  • [10] Work In Process Control for a High Product Mix Manufacturing System
    Olaitan, Oladipupo
    Yu, Quan
    Alfnes, Erlend
    [J]. MANUFACTURING SYSTEMS 4.0, 2017, 63 : 277 - 282
12345