Conductivity, morphology, interfacial chemistry, and stability of poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate): A photoelectron spectroscopy study

被引:477
|
作者
Crispin, X [1 ]
Marciniak, S
Osikowicz, W
Zotti, G
Van der Gon, AWD
Louwet, F
Fahlman, M
Groenendaal, L
De Schryver, F
Salaneck, WR
机构
[1] Linkoping Univ, Dept Phys & Measurement Technol, S-58183 Linkoping, Sweden
[2] Inst Consiglio Nazl Ric Energet & Interfasi, Co Stati Uniti 4, I-35127 Padua, Italy
[3] Eindhoven Univ Technol, Fac Appl Phys, NL-5600 MB Eindhoven, Netherlands
[4] Agfa Gevaert NV, R&D Mat Res, Dept Chem, B-2640 Mortsel, Belgium
[5] Linkoping Univ, Dept Sci & Technol, S-60174 Norrkoping, Sweden
[6] Katholieke Univ Leuven, Afdeling Fotochem & Spect, B-3001 Heverlee, Belgium
关键词
ESCA/XPS; poly(3,4-ethylene dioxythiophene); conductivity; degradation; interfacial chemistry; conducting polymers;
D O I
10.1002/polb.10659
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
X-ray photoelectron spectroscopy (XPS) has been used to characterize poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDT/PSS), one of the most common electrically conducting organic polymers. A correlation has been established between the composition, morphology, and polymerization mechanism, on the one hand, and the electric conductivity of PEDT/PSS, on the other hand. XPS has been used to identify interfacial reactions occurring at the polymer-on-ITO and polymer-on-glass interfaces, as well as chemical changes within the polymer blend induced by electrical stress and exposure to ultraviolet light. (C) 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 2561-2583, 2003
引用
收藏
页码:2561 / 2583
页数:23
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