Photoreflectance of 0.4-nm single-walled carbon nanotubes

被引:6
|
作者
Yang, CL
Hou, B
Li, IL
Li, ZM
Tang, ZK
Wang, JN
Liu, HJ
Ge, WK [1 ]
机构
[1] Hong Kong Univ Sci & Technol, Dept Phys, Kowloon, Hong Kong, Peoples R China
[2] Hong Kong Univ Sci & Technol, Inst Nanosci & Technol, Kowloon, Hong Kong, Peoples R China
关键词
D O I
10.1103/PhysRevB.71.233404
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The photoreflectance spectra of the 0.4-nm diameter single-walled carbon nanotubes (SWNTs) have been measured. The sharp features obtained from the experimental spectra have been identified to be the van Hove singularities associated with tubes of different chiralities, and fitted by the first-order derivatives of both real and imaginary parts of the dielectric functions, such that the band structures of the SWNTs are further clarified.
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收藏
页数:4
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