Reassessment of 182Hf AMS measurements at VERA

被引:12
|
作者
Forstner, O. [1 ]
Gnaser, H. [2 ]
Golser, R. [1 ]
Hanstorp, D. [3 ]
Martschini, M. [1 ]
Priller, A. [1 ]
Rohlen, J. [3 ]
Steier, P. [1 ]
Vockenhuber, C. [4 ]
Wallner, A. [1 ]
机构
[1] Univ Vienna, Fak Phys Isotopenforsch, A-1090 Vienna, Austria
[2] Tech Univ Kaiserslautern, Fachbereich Phys, D-67663 Kaiserslautern, Germany
[3] Univ Gothenburg, Dept Phys, SE-41296 Gothenburg, Sweden
[4] ETH, Inst Particle Phys, CH-8033 Zurich, Switzerland
关键词
Hf-182; AMS; Sputter ion source; Negative ion yield;
D O I
10.1016/j.nimb.2011.04.022
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The radioisotope Hf-182 (t(1/2) = 8.9 Ma) is of great interest for astrophysical applications as a chronometer for the early solar system or as possible live supernova remnant on earth. However, AMS measurements of Hf-182 are seriously influenced by the presence of the stable isobar W-182, which cannot be separated at typical AMS energies. Previous studies revealed a possible suppression of W-182 against Hf-182 by extracting the negatively charged pentafluoride HfF5- from the ion source, leading to a detection limit for Hf-182/Hf-180 in the order of 10(-11). However, this suppression behavior is in contrast to theoretical calculations of the electron affinity and recent measurements using SIMS instruments, where the achieved suppression cannot be reproduced. The aim of our study is to determine the effects of ion source background as well as further investigate the suppression of tungsten against hafnium by extracting negatively charged fluoride ions from different sample materials. The previously reported suppression factor of about 6000 could be increased to 36000 by careful tuning of the ion source using HfF4 as sample material. The trend of the theoretical electron affinities could be reproduced using atomic tungsten and hafnium instead of HfF4 as sample material. This supports the assumption that the major contribution of the tungsten background is not sputtered from the target matrix but comes from somewhere else in the ion source. Measurements from the second ion source show a higher background of tungsten and a lower suppression factor, i.e. careful design of the ion source is crucial. Moving the sputter beam over the target surface extending over the wheel holding the targets revealed the highest tungsten background was detected outside the sputter target position. Further investigations are necessary to locate the origin of the tungsten background in the ion source. Possible sources are the material used for the ion source construction or contaminations in the cesium used for sputtering. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:3180 / 3182
页数:3
相关论文
共 50 条
  • [1] 182Hf, a new isotope for AMS
    Vockenhuber, C
    Bichler, M
    Golser, R
    Kutschera, W
    Priller, A
    Steier, P
    Winkler, S
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2004, 223 : 823 - 828
  • [2] Development of isobar separation for 182Hf AMS measurements of astrophysical interest
    Vockenhuber, C.
    Bergmaler, A.
    Faestermann, T.
    Knie, K.
    Korschinek, G.
    Kutschera, W.
    Rugel, G.
    Steier, P.
    Vorderwinkler, K.
    Wallner, A.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 259 (01): : 250 - 255
  • [3] Progress in AMS Measurement of 182Hf at CIAE
    Dong Ke-Jun
    He Ming
    Li Zhen-Yu
    Wang Xiang-Gao
    Li Chao-Li
    You Qu-Bo
    Bao Yi-Wen
    Wu Shao-Yong
    Shen Hong-Tao
    Guan Yong-Jing
    Zhang Wei
    Fan Jin-Long
    Yang Lei
    Sun Hong-Qing
    Ding You-Qian
    He Guo-Zhu
    Li Shi-Zhuo
    Gong Jie
    He Xian-Wen
    Lu Li-Yan
    Wang Wei
    Hu Yue-Ming
    Yuan Jian
    Zhang Sheng-Dong
    Chang Yong-Fu
    Jiang Shan
    CHINESE PHYSICS LETTERS, 2010, 27 (11)
  • [4] Improvement on AMS measurement method for 182Hf
    Tuo, Fei
    Ruan, Xiangdong
    He, Ming
    Wu, Shaoyong
    Wang, Wei
    Hu, Yueming
    Bao, Yiwen
    Ouyang, Yinggen
    You, Qubo
    Dou, Yuling
    He, Guozhu
    Jiang, Shan
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2010, 268 (7-8): : 776 - 778
  • [5] Recent progress in AMS measurement of 182Hf at the CIAE
    Li Zhen-Yu
    He Ming
    Dong Ke-Jun
    He Guo-Zhu
    Li Chao-Li
    He Xian-Wen
    Zhang Wei
    Hu Hao
    Zheng Guo-Wen
    Li Heng
    Wu Shao-Yong
    Yuan Jian
    Jiang Shan
    CHINESE PHYSICS C, 2012, 36 (11) : 1145 - 1149
  • [6] Recent progress in AMS measurement of 182Hf at the CIAE
    李振宇
    何明
    董克君
    贺国珠
    李朝历
    何贤文
    张伟
    胡豪
    郑国文
    李恒
    武绍勇
    袁坚
    姜山
    Chinese Physics C, 2012, (11) : 1145 - 1149
  • [7] 182Hf的AMS测量技术研究
    李振宇
    姜山
    何明
    董克君
    胡豪
    郑国文
    李恒
    王晓波
    谢林波
    林德雨
    窦亮
    武绍勇
    游曲波
    包轶文
    原子能科学技术, 2013, 47 (02) : 172 - 177
  • [8] Developments in accelerator mass spectrometry (AMS) method for 182Hf
    Tuo Fei
    He Ming
    Shen Hong-Tao
    Wu Shao-Yong
    Hu Yue-Ming
    Bao Yi-Wen
    Ouyang Ying-Gen
    You Qu-Bo
    Dou Yu-Ling
    Jiang Shan
    CHINESE PHYSICS C, 2008, 32 : 201 - 204
  • [9] Measurement of 182Hf with HI-13 AMS system
    Qiu, Jiuzi
    Jiang, Shan
    He, Ming
    Yin, Xinyi
    Dong, Kejun
    Guan, Yongjing
    Bao, Yiwen
    Wu, Shaoyong
    Yuan, Jian
    Yang, Bingfan
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 259 (01): : 246 - 249
  • [10] Research on measurement of 182Hf with HI-13 AMS system
    Qiu, Jiu-Zi
    Jiang, Shan
    He, Ming
    Yin, Xin-Yi
    Dong, Ke-Jun
    Guan, Yong-Jing
    Wu, Shao-Yong
    HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION, 2007, 31 (08): : 719 - 723