X-ray and electron induced oligomerization of condensed 3-hexylthiophene

被引:33
|
作者
Hernandez, JE
Ahn, H
Whitten, JE [1 ]
机构
[1] Univ Lowell, Dept Chem, Lowell, MA 01854 USA
[2] Univ Lowell, Ctr Adv Mat, Lowell, MA 01854 USA
来源
JOURNAL OF PHYSICAL CHEMISTRY B | 2001年 / 105卷 / 35期
关键词
D O I
10.1021/jp010314o
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
MgK alpha X-ray and low energy electron irradiation of thick physisorbed layers of 3-hexylthiophene condensed on clean gold at 145 K results in formation of an organic film that does not desorb when the sample is warmed to room temperature. Cls and S2p X-ray photoelectron spectra of the X-ray and electron-formed films are similar to those of chemically synthesized poly(3-hexylthiophene). Ultraviolet photoelectron spectroscopy indicates the presence of thiophene ring electronic states, consistent with retention of conjugation. Comparison of the valence spectra with condensed monomer and poly(3-hexylthiophene) indicates that the X-ray and electron-formed films are oligomeric rather than polymeric, in contrast to related studies on condensed thiophene. This difference suggests that the aliphatic side chain reduces monomer mobility during the polymerization process, leading to shorter chains. Electron bombardment with 5 keV electrons results in films of micron thickness, as determined by profilometry. The ability to lithographically oligomerize the monomer is demonstrated by forming a dot with an electron beam. FTIR spectroscopy of electron-formed films shows vibrations consistent with the formation of linearly oligomerized 3-hexylthiophene.
引用
收藏
页码:8339 / 8344
页数:6
相关论文
共 50 条
  • [1] Comment on "X-ray and electron induced oligomerization of condensed 3-hexylthiophene"
    Ahn, H
    Whitten, JE
    JOURNAL OF PHYSICAL CHEMISTRY B, 2002, 106 (43): : 11404 - 11405
  • [2] Adsorption and x-ray induced polymerization of condensed 3-hexylthiophene on polycrystalline aluminum.
    Hernandez, JE
    Whitten, JE
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 220 : U359 - U359
  • [3] X-ray diffraction and optical studies of fractionalized regioregular poly(3-hexylthiophene)
    Kaniowski, T
    Luzny, W
    Niziol, S
    Sanetra, J
    Trznadel, M
    SYNTHETIC METALS, 1998, 92 (01) : 7 - 12
  • [4] Studies of degradation behaviors of poly (3-hexylthiophene) layers by X-ray photoelectron spectroscopy
    Seo, Hyun Ook
    Jeong, Myung-Geun
    Kim, Kwang-Dae
    Kim, Dae Han
    Kim, Young Dok
    Lim, Dong Chan
    SURFACE AND INTERFACE ANALYSIS, 2014, 46 (08) : 544 - 549
  • [5] Further insights into the photodegradation of poly(3-hexylthiophene) by means of X-ray photoelectron spectroscopy
    Manceau, Matthieu
    Gaume, Julien
    Rivaton, Agnes
    Gardette, Jean-Luc
    Monier, Guillaume
    Bideux, Luc
    THIN SOLID FILMS, 2010, 518 (23) : 7113 - 7118
  • [6] Resolving the backbone tilt of crystalline poly(3-hexylthiophene) with resonant tender X-ray diffraction
    Freychet, Guillaume
    Chantler, Paul
    Huang, Yuxuan
    Tan, Wen Liang
    Zhernenkov, Mikhail
    Nayak, Nagaraj
    Kumar, Anil
    Gilhooly-Finn, Peter A.
    Nielsen, Christian B.
    Thomsen, Lars
    Roychoudhury, Subhayan
    Sirringhaus, Henning
    Prendergast, David
    McNeill, Christopher R.
    MATERIALS HORIZONS, 2022, 9 (06) : 1649 - 1657
  • [7] X-Ray Scattering Reveals Ion-Induced Microstructural Changes During Electrochemical Gating of Poly(3-Hexylthiophene)
    Thomas, Elayne M.
    Brady, Michael A.
    Nakayama, Hidenori
    Popere, Bhooshan C.
    Segalman, Rachel A.
    Chabinyc, Michael L.
    ADVANCED FUNCTIONAL MATERIALS, 2018, 28 (44)
  • [8] X-ray structural and crystallinity studies of low and high molecular weight poly(3-hexylthiophene)
    Joshi, S.
    Grigorian, S.
    Pietsch, U.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2008, 205 (03): : 488 - 496
  • [9] Structural Evolution of Spin Coated Poly(3-hexylthiophene Thin Films Probed by X-Ray Reflectivity
    Saifuddin, Md
    Mukhopadhyay, Mala
    Biswas, Arindam
    Hazra, Satyajit
    DAE SOLID STATE PHYSICS SYMPOSIUM 2019, 2020, 2265
  • [10] Determination of the Crystallinity of Semicrystalline Poly(3-hexylthiophene) by Means of Wide-Angle X-ray Scattering
    Balko, Jens
    Lohwasser, Ruth H.
    Sommer, Michael
    Thelakkat, Mukundan
    Thurn-Albrecht, Thomas
    MACROMOLECULES, 2013, 46 (24) : 9642 - 9651