Reliability assessment based on fuzzy logic

被引：0
|
作者：
Bâzu, M [1 ]
机构：
[1] Natl Inst Res & Dev Microtechnol, Bucharest, Romania
来源：
COMPUTATIONAL INTELLIGENCE FOR MODELLING, CONTROL & AUTOMATION - EVOLUTIONARY COMPUTATION & FUZZY LOGIC FOR INTELLIGENT CONTROL, KNOWLEDGE ACQUISITION & INFORMATION RETRIEVAL | 1999年 / 55卷
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Two new methods using fuzzy logic for reliability assessment of electronic components are proposed. First a fuzzy logic approach in the rapid estimation of the reliability by using accelerated life tests is described. Then, the fuzzy logic is used for evaluating the reliability of the items undergoing a screening sequence. Five case studies prove the efficiency of the proposed methods.
引用
收藏
页码：470 / 475
页数：6
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