Optical measurements of single CdTe self-assembled quantum dots grown on ZnTe/GaSb

被引：4
|
作者：
Pimpinella, R. E. [1 ]
Mintairov, A. M. [2 ]
Liu, X. [1 ]
Kosel, T. H. [2 ]
Merz, J. L. [2 ]
Furdyna, J. K. [1 ]
Dobrowolska, M. [1 ]
机构：
[1] Univ Notre Dame, Dept Phys, Notre Dame, IN 46556 USA
[2] Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2011年 / 29卷 / 03期
关键词：
MICROSCOPY;
D O I：
10.1116/1.3562182
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The CdTe quantum dots (QDs) grown on a ZnTe epilayer deposited directly on a GaSb substrate are studied by transmission electron microscopy (TEM) and near-field scanning optical microscopy. High resolution TEM images show CdTe QD of planoconvex shape. Near-field photoluminescence (NPL) in an applied magnetic field is used to measure the Zeeman splitting and diamagnetic shift of single CdTe QDs. Finally, time resolved NPL measurements suggest that the higher energy lines in the CdTe QD NPL spectra correspond to exciton transitions occurring in larger CdTe QDs and have shorter exciton lifetimes. (C) 2011 American Vacuum Society. [DOI: 10.1116/1.3562182]
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页数：4
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