Subwavelength Resonant Gratings for Micrometric Strain Sensors

被引:2
|
作者
Algorri, J. F. [1 ]
Garcia-Camara, B. [1 ]
Urruchi, V. [1 ]
Sanchez-Pena, J. M. [1 ]
Vergaz, R. [1 ]
机构
[1] Univ Carlos III Madrid, Dept Elect Technol, Madrid 28911, Spain
关键词
Nanowires; optical strain gauge; plasmonic; subwavelength grating; GOLD NANOPARTICLES; VISIBLE-LIGHT; INTERFEROMETRY;
D O I
10.1109/JSTQE.2016.2596261
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A subwavelength resonant grating based on plasmonic silver nanowires is proposed and theoretically analyzed. The structure is composed of several Ag nanowires distributed in a parallel configuration with subwavelength grating constant. Despite the use of TM mode, we have discovered that for certain subwavelength distances, the combination with the plasmonic resonances of the nanowires produces a strong reflection at the resonant peaks. This structure could be used to measure deformation variation down to the nanometer range and use it as a micrometric all optical gauge. The effects of the size of the cylindrical metal nanowires on the performance of the sensing have been studied in detail. Two operation modes are observed depending on the structural parameters. Either a phase or amplitude modulation in the visible range could be obtained. In the first case, a sensitivity of 7.5 pm/mu epsilon has been obtained. In the second case, an amplitude modulation of -256.10(-6) dB/mu epsilon has been obtained. This kind of sensor would be cheap and easy to measure by means of a fiber optic link. The structure is simple and easily scalable.
引用
收藏
页码:98 / 102
页数:5
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