Development of computer assisted electron microscopy

被引：0
|
作者：
Ishizuka, K [1 ]
Kimura, Y [1 ]
Pan, M [1 ]
Meyer, CE [1 ]
Krivanek, OL [1 ]
机构：
[1] Gatan R&D, Pleasanton, CA 94566 USA
来源：
ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION | 1998年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：261 / 262
页数：2
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