Surface profiling acoustic microscopy

被引：0
|
作者：
Adams, Tom [1 ]
机构：
[1] Sonoscan Inc, Elk Grove Village, IL USA
来源：
ADVANCED MATERIALS & PROCESSES | 2008年 / 166卷 / 07期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Both surface topography and internal structure can be revealed by ultrasonic pulses.
引用
收藏
页码：29 / 30
页数：2
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