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Thin-film evolution equation for a strained solid film on a deformable substrate: Numerical steady states
被引:22
|作者:
Tekalign, W. T.
Spencer, B. J.
机构:
[1] Rochester Inst Technol, Sch Math Sci, Rochester, NY 14623 USA
[2] SUNY Buffalo, Dept Math, Buffalo, NY 14260 USA
基金:
美国国家科学基金会;
关键词:
D O I:
10.1063/1.2785024
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We consider the nonlinear behavior of the thin-film evolution equation for a strained solid film on a substrate. The evolution equation describes morphological changes to the film by surface diffusion in response to elastic energy, surface energy, and wetting energy. Due to the thin-film approximation, the elastic response of the film is determined analytically, resulting in a self-contained evolution equation which does not require separate numerical solution of the full three-dimensional elasticity problem. Using a pseudospectral predictor-corrector method we numerically determine the family of steady state solutions to this evolution equation which correspond to quantum dot and quantum ridge morphologies.
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