The overlayer structure on the Si(001)-(2x3)-Ag surface determined by X-ray photoelectron diffraction

被引：17
|
作者：
Shimomura, M [1 ]
Abukawa, T
Higa, M
Nakamura, M
Shivaprasad, SM
Yeom, HW
Suzuki, S
Sato, S
Tani, J
Kono, S
机构：
[1] Tohoku Univ, Sci Measurements Res Inst, Sendai, Miyagi 9808577, Japan
[2] Tohoku Univ, Dept Phys, Sendai, Miyagi 9808577, Japan
[3] Tohoku Univ, Inst Fluid Sci, Sendai, Miyagi 9808577, Japan
来源：
SURFACE REVIEW AND LETTERS | 1998年 / 5卷 / 05期
关键词：
D O I：
10.1142/S0218625X98001286
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
X-ray photoelectron diffraction (XPD) patterns of Ag 3d electrons from a single domain Si(001)-(2 x 3)Ag surface were examined. Single scattering cluster and multiple scattering cluster simulations of the Ag 3d XPD patterns indicate an overlayer that contains four Ag atoms aligned almost linearly along the threefold direction in the unit cell. on the Si(001) surface. The four-Ag-atom arrangement is discussed in the light of other information obtained by STM, LEEM and photoemission studies, finding it very feasible.
引用
收藏
页码：953 / 958
页数：6
相关论文
共 50 条
  • [1] Structure of Si(001)-(4x3)-In surface studied by X-ray photoelectron diffraction
    Shimomura, M
    Nakamura, T
    Kim, KS
    Abukawa, T
    Tani, J
    Kono, S
    [J]. SURFACE REVIEW AND LETTERS, 1999, 6 (06) : 1097 - 1102
  • [2] SYMMETRY, STRUCTURE, AND STEP INDUCED ORDERING OF THE SI(001)-(2X3)AG SURFACE
    MICHELY, T
    REUTER, MC
    COPEL, M
    TROMP, RM
    [J]. PHYSICAL REVIEW LETTERS, 1994, 73 (15) : 2095 - 2098
  • [3] Surface X-ray diffraction study on the Si(001)2×1 structure
    Univ of Tokyo, Tokyo, Japan
    [J]. Surf Sci, 1-3 (L846-L850):
  • [4] Sb/Si(110) 2x3 -: a photoelectron diffraction study
    Schürmann, M
    Dreiner, S
    Berges, U
    Westphal, C
    [J]. APPLIED SURFACE SCIENCE, 2003, 212 : 131 - 134
  • [5] X-ray photoelectron diffraction study of Si(001)c(4x4)-C surface
    Kosugi, R
    Sumitani, S
    Abukawa, T
    Takakuwa, Y
    Suzuki, S
    Sato, S
    Kono, S
    [J]. SURFACE SCIENCE, 1998, 412-13 : 125 - 131
  • [6] AG ON SI(001)(2X1) FORMATION OF A 2X3 SUPERSTRUCTURE
    WINAU, D
    ITOH, H
    SCHMID, AK
    ICHINOKAWA, T
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 2082 - 2085
  • [7] INTERFACE STRUCTURE OF THE 1 MONOLAYER (2X1)-SI/GAAS(001) SYSTEM BY X-RAY PHOTOELECTRON DIFFRACTION
    TRAN, TT
    CHAMBERS, SA
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (04): : 1459 - 1462
  • [8] Surface x-ray diffraction on K/Si(001)(2x1) and Cs/Si(001)(2x1)
    Meyerheim, HL
    Jedrecy, N
    Sauvage-Simkin, M
    Pinchaux, R
    [J]. PHYSICAL REVIEW B, 1998, 58 (04): : 2118 - 2125
  • [9] Atomic structure of the c(4 × 2) surface reconstruction of Ge(001) as determined by x-ray diffraction
    [J]. Phys Rev Lett, 9 (1771):
  • [10] AUGER AND X-RAY PHOTOELECTRON DIFFRACTION IN MGO(001)
    TRAN, TT
    CHAMBERS, SA
    [J]. APPLIED SURFACE SCIENCE, 1994, 81 (02) : 161 - 173
12345