MOMS -: Magnetic Orientation Mossbauer Spectroscopy:: Determination of spin orientations in ion irradiated iron films -: Formation of a uniaxial spin orientation by ion implantation into thin iron films

Here, a xenon-ion induced magnetic texturing of iron films using depth-sensitive and angle-dependent Conversion Electron Mossbauer Spectroscopy as Magnetic Orientation Mossbauer Spectroscopy (MOMS) in combination with Magneto-optical Kerr Effect (MOKE), Rutherford Backscattering Spectrometry (RBS) and X-Ray Diffraction (XRD) is reported. Three 75 nm thick Fe films containing a 15 nm 57 Fe marker layer at different depths were deposited on Si(100) substrates and irradiated under well defined mechanical strain with 200 keV Xe ions. The ion-induced changes of the magnetization were related to the lattice expansion at various depths produced by the implanted xenon. A complete uniaxial orientation of all spins along the mechanical stress axis was found by Mossbauer spectroscopy for the, sample with the sensitive marker layer being in the centre of the ferromagnetic film. This agrees with the angular properties of the macroscopic magnetic hysteresis curve measured by MOKE.