Charge-ordered state in single-crystalline CaFeO3 thin film studied by x-ray anomalous diffraction -: art. no. 156405

被引:36
|
作者
Akao, T
Azuma, Y
Usuda, M
Nishihata, Y
Mizuki, J
Hamada, N
Hayashi, N
Terashima, T
Takano, M
机构
[1] Japan Atom Energy Res Inst, Synchrotron Radiat Res Ctr, Mikazuki, Hyogo 6795148, Japan
[2] Sci Univ Tokyo, Fac Sci & Technol, Chiba 2788510, Japan
[3] Kyoto Univ, Inst Chem Res, Kyoto 6110011, Japan
关键词
D O I
10.1103/PhysRevLett.91.156405
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
X-ray anomalous diffraction, together with a band-structure calculation, was employed to obtain a quantitative understanding of the charge-ordering state in a single-crystalline CaFeO3 thin film. The experimental result shows a characteristic energy dispersion of the nearly inhibited reflection at 150 K, implying Fe atoms split into two distinct states. The energy dispersion is in good agreement with the calculated spectrum based on the LDA+U scheme. The calculation also reveals an electronic structure of the system where holes in the oxygen orbital surround one of the distinct Fe atoms, in spite of the total electron number in both Fe atoms remaining unchanged.
引用
收藏
页数:4
相关论文
共 50 条
  • [1] Comment on "x-ray anomalous scattering study of a charge-ordered state in NaV2O5" -: art. no. 189702
    Lorenzo, JE
    Bos, S
    Grenier, S
    Renevier, H
    Ravy, S
    PHYSICAL REVIEW LETTERS, 2001, 87 (18)
  • [2] Comment on "x-ray anomalous scattering study of a charge-ordered state in NaV2O5" -: art. no. 189701
    Garcia, J
    Benfatto, M
    PHYSICAL REVIEW LETTERS, 2001, 87 (18)
  • [3] Comment on "x-ray anomalous scattering study of a charge-ordered state in NaV2O5" -: Reply -: art. no. 189703
    Nakao, H
    Ohwada, K
    Takesue, N
    Fujii, Y
    Isobe, M
    Ueda, Y
    von Zimmermann, M
    Hill, JP
    Gibbs, D
    Woicik, JC
    Koyama, I
    Murakami, Y
    PHYSICAL REVIEW LETTERS, 2001, 87 (18)
  • [4] Strain determination in multilayers by complementary anomalous x-ray diffraction -: art. no. 195307
    Schülli, TU
    Lechner, RT
    Stangl, J
    Springholz, G
    Bauer, G
    Sztucki, M
    Metzger, TH
    PHYSICAL REVIEW B, 2004, 69 (19) : 195307 - 1
  • [5] Inelastic X-ray Scattering Measurement on Single-Crystalline GeSn Thin Film
    M. Chino
    R. Yokogawa
    A. Ogura
    H. Uchiyama
    H. Tatsuoka
    Y. Shimura
    Journal of Electronic Materials, 2023, 52 : 5128 - 5133
  • [6] Inelastic X-ray Scattering Measurement on Single-Crystalline GeSn Thin Film
    Chino, M.
    Yokogawa, R.
    Ogura, A.
    Uchiyama, H.
    Tatsuoka, H.
    Shimura, Y.
    JOURNAL OF ELECTRONIC MATERIALS, 2023, 52 (08) : 5128 - 5133
  • [7] X-ray anomalous scattering study of a charge-ordered state in NaV2O5
    Nakao, H
    Ohwada, K
    Takesue, N
    Fujii, Y
    Isobe, M
    Ueda, Y
    Von Zimmermann, M
    Hill, JP
    Gibbs, D
    Woicik, JC
    Koyama, I
    Murakami, Y
    PHYSICAL REVIEW LETTERS, 2000, 85 (20) : 4349 - 4352
  • [8] Single-crystalline BiMnO3 studied by temperature-dependent x-ray diffraction and Raman spectroscopy
    Toulemonde, P.
    Bordet, P.
    Bouvier, P.
    Kreisel, J.
    PHYSICAL REVIEW B, 2014, 89 (22):
  • [9] X-ray anomalous scattering investigation of BaVS3 -: art. no. 033102
    Fagot, S
    Foury-Leylekian, P
    Ravy, S
    Pouget, JP
    Lorenzo, É
    Joly, Y
    Greenblatt, M
    Lobanov, MV
    Popov, G
    PHYSICAL REVIEW B, 2006, 73 (03)
  • [10] Enhancement of the spin ordering and formation of the charge-ordered state in a strained La0.7Ca0.3MnO3-δ thin film with oxygen deficiency -: art. no. 014403
    Prokhorov, VG
    Komashko, VA
    Svetchnikov, VL
    Lee, YP
    Park, JS
    PHYSICAL REVIEW B, 2004, 69 (01)