A new method of testability prediction on model and probability analysis

被引：0

作者：

Yang Zhiyong ^{[1
]}

Xu Aiqiang ^{[2
]}

Niu Shuangcheng ^{[2
]}

Wang Ziling ^{[2
]}

机构：

[1] Second Artillery Engn Acad, Xian 710025, Peoples R China

[2] Naval Aeronaut Engn Inst, Yantan 264001, Peoples R China

来源：

ICEMI 2007: PROCEEDINGS OF 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOL III | 2007年

关键词：

testability prediction; multi-signal model; fault-test dependency matrix; diagnostic logic; FDR; FIR;

D O I：

暂无

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

For improving the accuracy of fault-test dependency analysis and test prediction, we introduce two new additional properties into multi-signal model and give a new method of testability prediction on refined multi-signal model. The paper illustrates the method and procedure of testability prediction in two ways. The new method can improve the accuracy of estimating FDR and FIR evidently.

引用

页码：991 / +

页数：2

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