Complex permittivity and permeability measurement at elevated temperatures using rectangular waveguide

被引：4
|
作者：
Wolfson, BJ
Wentworth, SM
机构：
[1] Phase IV Syst Inc, Huntsville, AL 35805 USA
[2] Auburn Univ, Dept Elect & Comp Engn, Auburn, AL 36830 USA
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2003年 / 38卷 / 06期
关键词：
microwave properties; permittivity; permeability; measurement;
D O I：
10.1002/mop.11086
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We describe a method to determine a material's complex permittivity and permeability over a range of temperatures. Input impedances are calculated from scattering parameters measured with the sample terminated by two offset shorts. These are manipulated to solve for complex permittivity and permeability over the frequency band of the waveguide. (C) 2003 Wiley Periodicals, Inc.
引用
收藏
页码：449 / 453
页数：5
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