Soft X-Ray Beam Induced Current Technique

被引：6

作者：

Watts, B. ^{[1
,4
]}

Queen, D. ^{[2
]}

Kilcoyne, A. L. D. ^{[3
]}

Tyliszczak, T. ^{[3
]}

Hellman, F. ^{[2
]}

Ade, H. ^{[1
]}

机构：

[1] North Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA

[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[3] Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA

[4] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

来源：

9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2009年 / 186卷

基金：

美国国家科学基金会;

关键词：

D O I：

10.1088/1742-6596/186/1/012023

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Direct mapping of the charge transport efficiency of polymer solar cell devices using a soft X-ray beam induced current (SoXBIC) method is described. By fabricating a polymer solar cell on an x-ray transparent substrate, we demonstrate the ability to map polymer composition and nanoscale structure within an operating solar cell device and to simultaneously measure the local charge transport efficiency via the short-circuit current. A simple model is calculated and compared to experimental SoXBIC data of a PFB:F8BT bulk-heterojunction device in order to gain greater insight into the device operation and physics.

引用

页数：3

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