Band gap determination in thick films from reflectance measurements

被引：237
|
作者：
Kumar, V
Sharma, SK
Sharma, TP [1 ]
Singh, V
机构：
[1] CCS Univ, Dept Phys, Meerut 250004, Uttar Pradesh, India
[2] SG PG Coll, Meerut, Uttar Pradesh, India
来源：
OPTICAL MATERIALS | 1999年 / 12卷 / 01期
关键词：
band gap; screen printing; reflection spectra; semiconductors;
D O I：
10.1016/S0925-3467(98)00052-4
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Spectroscopic techniques are very useful for characterising semiconducting materials. We demonstrate here a new formulation and method for measuring the energy band gap in thick films from the reflectance data. (C) 1999 Elsevier Science B.V All rights reserved.
引用
收藏
页码：115 / 119
页数：5
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