Cross Scanning Near Field Measurement for Symmetrical Planar Array

被引：0
|
作者：
Arai, Hiroyuki [1 ]
Suzuki, Riho [1 ]
机构：
[1] Yokohama Natl Univ, Grad Sch Engn, Dept Elect & Comp Engn, Yokohama, Kanagawa, Japan
来源：
2018 IEEE CONFERENCE ON ANTENNA MEASUREMENTS & APPLICATIONS (CAMA) | 2018年
关键词：
far field estimation; phase retrieval; sampling points reduction; cross scanning; near field measurement; PHASE;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a cross scanning near field measurement for symmetrical planar arrays to reduce sampling data and the measuring time. The cross scanning along x and y axes decreases sampling points to 2N from N-2 data of planar 2D scanning. The constraint on measured antennas, the symmetrical aperture distribution, is not critical, which is shown by error simulation. The proposed method is demonstrated by measurements compared with 2D scanning results.
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页数：2
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