Exploiting Total Internal Reflection Geometry for Terahertz Devices and Enhanced Sample Characterization

被引:19
|
作者
Sun, Qiushuo [1 ]
Chen, Xuequan [1 ]
Liu, Xudong [2 ]
Stantchev, Rayko I. [1 ]
Pickwell-MacPherson, Emma [1 ,3 ]
机构
[1] Chinese Univ Hong Kong, Dept Elect Engn, Shatin, Hong Kong 999077, Peoples R China
[2] Shenzhen Univ, Guangdong Key Lab Biomed Measurements & Ultrasoun, Natl Reg Key Technol Engn Lab Med Ultrasound, Dept Biomed Engn,Sch Med, Shenzhen 518060, Peoples R China
[3] Univ Warwick, Phys Dept, Coventry CV4 7AL, W Midlands, England
来源
ADVANCED OPTICAL MATERIALS | 2020年 / 8卷 / 03期
关键词
graphene; metamaterials; modulators; polarization; terahertz devices; terahertz imaging; total internal reflection; TIME-DOMAIN SPECTROSCOPY; HIGH EXTINCTION RATIO; THIN-FILM; GRAPHENE; THZ; MODULATION; POLARIZER; ROBUST; TRANSMISSION; TECHNOLOGY;
D O I
10.1002/adom.201900535
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To promote potential applications of terahertz (THz) technology, more advanced functional THz devices with high performance are needed, including modulators, polarizers, lenses, wave retarders, and antireflection coatings. This work summarizes recent progress in THz components built on functional materials including graphene, vanadium dioxide, and metamaterials. The key message is that, while the choice of materials used in such devices is important, the geometry in which they are employed also has a significant effect on the performance achieved. In particular, devices operating in total internal reflection geometry are reviewed, and it is explained how this geometry is able to be exploited to achieve a variety of THz devices with broadband operation.
引用
收藏
页数:15
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