Locally optimal tests for exponential distributions with type-I censoring

被引:4
|
作者
Liang, Tachen [2 ]
Huang, Wen-Tao [1 ]
Yang, Kun-Cheng [3 ]
机构
[1] Tamkang Univ, Dept Management Sci & Decis Making, Taipei, Taiwan
[2] Wayne State Univ, Dept Math, Detroit, MI 48202 USA
[3] Tamkang Univ, Grad Inst Management Sci, Taipei, Taiwan
关键词
D O I
10.1016/j.csda.2007.11.015
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
This article studies a locally optimal test phi* for testing H-0 : theta >= theta(0) versus H-1 : theta < theta(0) for the lifetime parameter theta in an exponential distribution based on type-l censored data. Certain properties associated with phi* are addressed. We compare the performance of phi* with that of Spurrier and Wei's [Spurrier, J.D., Wei, L.J., 1980. A test of the parameter of the exponential distribution in the type-I censoring case. J. Amer. Statist. Assoc. 75, 405-409] test phi(Sw), which is based on the MLE theta<(ML)over cap> of theta. The exact powers and asymptotic powers of phi* and phi(SW) are computed. The numerical results indicate that the power of phi* is better than that of phi(SW) when 0 (0 < 0 < 00) is close to theta(0). (c) 2007 Elsevier B.V. All rights reserved.
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页码:3603 / 3615
页数:13
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