Multi-scale statistical process monitoring in machining

被引:34
|
作者
Li, XL [1 ]
Yao, X [1 ]
机构
[1] Univ Birmingham, Sch Comp Sci, CERCIA, Birmingham B15 2TT, W Midlands, England
关键词
condition monitoring; machining processes; statistical process control (SPC); wavelet transform (WT);
D O I
10.1109/TIE.2005.847580
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Most practical industrial process data contain contributions at multiple scales in time and frequency. Unfortunately, conventional statistical process control approaches often detect events at only one scale. This paper addresses a new method, called multiscale statistical process monitoring, for tool condition monitoring in a machining process, which integrates discrete wavelet transform (WT) and statistical process control. Firstly, discrete WT is applied to decompose the collected data from the manufacturing system into uncorrelated components. Next, the detection limits are formed for each decomposed component by using Shewhart control charts. A case study, i.e., tool condition monitoring in turning using an acoustic emission signal, demonstrates that the new method is able to detect abnormal events (serious tool wear or breakage) in the machining process.
引用
收藏
页码:924 / 927
页数:4
相关论文
共 50 条
  • [1] Improvement on multivariate statistical process monitoring using multi-scale ICA
    Liu, F
    Wu, CY
    [J]. INDEPENDENT COMPONENT ANALYSIS AND BLIND SIGNAL SEPARATION, PROCEEDINGS, 2006, 3889 : 376 - 383
  • [2] A multi-scale orthogonal nonlinear strategy for multi-variate statistical process monitoring
    Maulud, A.
    Wang, D.
    Romagnoli, J. A.
    [J]. JOURNAL OF PROCESS CONTROL, 2006, 16 (07) : 671 - 683
  • [3] Statistical Process Control Based on Multi-scale Wavelets Analysis
    Shi Rong-zhen
    Liu Fei
    [J]. 2008 IEEE INTERNATIONAL SYMPOSIUM ON KNOWLEDGE ACQUISITION AND MODELING WORKSHOP PROCEEDINGS, VOLS 1 AND 2, 2008, : 136 - 138
  • [4] Multivariate process monitoring and fault diagnosis by multi-scale PCA
    Misra, M
    Yue, HH
    Qin, SJ
    Ling, C
    [J]. COMPUTERS & CHEMICAL ENGINEERING, 2002, 26 (09) : 1281 - 1293
  • [5] Multivariate process monitoring and analysis based on multi-scale KPLS
    Zhang, Yingwei
    Hu, Zhiyong
    [J]. CHEMICAL ENGINEERING RESEARCH & DESIGN, 2011, 89 (12A): : 2667 - 2678
  • [6] The multi-scale analysis of ceramic surface topography created in abrasive machining process
    Niemczewska-Wojcik, Magdalena
    Wojcik, Artur
    [J]. MEASUREMENT, 2020, 166
  • [7] Robust multi-scale principal components analysis with applications to process monitoring
    Wang, D
    Romagnoli, JA
    [J]. JOURNAL OF PROCESS CONTROL, 2005, 15 (08) : 869 - 882
  • [8] A Multi-Scale Statistical Control Process for Mobility and Interference Identification in IEEE 802.11
    Ricardo Rabelo Oliveira
    Antônio Alfredo Loureiro
    Alejandro C. Frery
    [J]. Mobile Networks and Applications, 2009, 14 : 725 - 743
  • [9] A Multi-Scale Statistical Control Process for Mobility and Interference Identification in IEEE 802.11
    Oliveira, Ricardo Rabelo
    Loureiro, Antnio Alfredo
    Frery, Alejandro C.
    [J]. MOBILE NETWORKS & APPLICATIONS, 2009, 14 (06): : 725 - 743
  • [10] Multi-scale statistical signal processing of cutting force in cutting tool condition monitoring
    Dong Gao
    Zhirong Liao
    Zekun Lv
    Yong Lu
    [J]. The International Journal of Advanced Manufacturing Technology, 2015, 80 : 1843 - 1853