Stress-driven grain growth in nanocrystalline Pt thin films

被引：70

作者：

Sharon, J. A. ^{[1
]}

Su, P-C ^{[2
,3
]}

Prinz, F. B. ^{[3
]}

Hemker, K. J. ^{[1
]}

机构：

[1] Johns Hopkins Univ, Dept Mech Engn, Baltimore, MD 21218 USA

[2] Natl Taiwan Univ, Dept Mech Engn, Taipei 10617, Taiwan

[3] Stanford Univ, Dept Mech Engn, Stanford, CA 94305 USA

来源：

SCRIPTA MATERIALIA | 2011年 / 64卷 / 01期

关键词：

Thin films; Nanocrystalline materials; Mechanical properties; Tension test; Stress driven grain growth; ROOM-TEMPERATURE; DEFORMATION; MIGRATION; AL; BOUNDARIES; MOTION; CU;

D O I：

10.1016/j.scriptamat.2010.08.057

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Microtensile experiments and electron microscopy have been utilized to characterize the mechanical behavior of nanocrystalline Pt films The behavior can be described as high strength with limited strain to failure The tensile deformation triggers a microstructural evolution increasing the grain size from 20 nm in the initial state to 33 nm in the deformed state This observation of grain growth at a homologous temperature of 0 146 provides further evidence of the role of mechanical stress in initiating grain growth in nanocrystalline metals (C) 2010 Acta Materialia Inc Published by Elsevier Ltd All rights reserved

引用

页码：25 / 28

页数：4

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