Adding noise to improve measurement

被引：31
|
作者：
Andò, B [1 ]
Graziani, S [1 ]
机构：
[1] Univ Catania, Dipartimento Eletr Elettron & Sistemist, I-95124 Catania, Italy
来源：
IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE | 2001年 / 4卷 / 01期
关键词：
D O I：
10.1109/5289.911170
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The possibility of improving the performance of several system classes in the presence of noise is shown. The strategy depends on the application. Stochastic resonance can reduce threshold while suitable noise modulation can linearize thresholds.
引用
收藏
页码：24 / 31
页数：8
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