Phase sensitivity of off-axis digital holography

被引:12
|
作者
Chen, Shichao [1 ]
Li, Chengshuai [1 ]
Ma, Cheng [2 ]
Poon, T. -C. [1 ]
Zhu, Yizheng [1 ]
机构
[1] Virginia Tech, Dept Elect & Comp Engn, Blacksburg, VA 24061 USA
[2] Tsinghua Univ, Dept Elect Engn, Beijing 100084, Peoples R China
关键词
SHIFTING INTERFEROMETRY; ELECTRON HOLOGRAPHY; MICROSCOPY; DYNAMICS;
D O I
10.1364/OL.43.004993
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In off-axis digital holography, the Fourier transform-based algorithm is commonly used for signal processing. Here, we derive the theoretical phase sensitivity of this algorithm, which can be calculated from a single 2D hologram. This algorithm sensitivity represents the best achievable sensitivity of a system using this algorithm. Our derivation treats the signal in its most general form, considering non-uniform illumination and the effect of sideband filtering. As a result, phase sensitivity varies spatially, determined by local signal-to-noise ratio. Sensitivity expressions for both shot noise and uniform noise models are given. These results are validated with simulations and experiments. Significantly, this theoretical sensitivity can serve as a baseline metric for assessing performance of a phase-imaging system, such as experimental sensitivity and hardware stability, which are critical for high-sensitivity quantitative phase imaging. In addition, the results are equally applicable to other interferometric techniques with similar interferogram patterns and signal processing algorithms. (C) 2018 Optical Society of America
引用
收藏
页码:4993 / 4996
页数:4
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