Comparison of defects created by plasma-based ion implantation and conventional implantation of hydrogen in germanium

被引:1
|
作者
David, M. L. [1 ]
Pailloux, F. [1 ]
Drouet, M. [1 ]
Beaufort, M. F. [1 ]
Barbot, J. F. [1 ]
Simoen, E. [2 ]
Claeys, C. [2 ,3 ]
机构
[1] Univ Poitiers, Met Phys Lab, UMR 6630, BP 30179, F-86962 Futuroscope, France
[2] IMEC, B-3001 Leuven, Belgium
[3] Katholieke Univ Leuven, EE Dept, B-3001 Leuven, Belgium
关键词
germanium; platelets; plasma based ion implantation; hydrogen;
D O I
10.4028/www.scientific.net/SSP.131-133.101
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
(001) n-type Ge has been implanted at given fluence and intermediate temperature with hydrogen ions using two processes: conventional in-line implantation and plasma based ion implantation. The as-created microstructure has been compared using transmission electron microscopy. In particular, it has been shown that the major differences observed are due to the implantation temperature, much higher during the PBII process. This suggests that plasma based ion implantation could be used for layer transfer in spite of a higher surface roughness observed after the PBII process.
引用
收藏
页码:101 / +
页数:3
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