Cortical Current Density vs. Surface EEG for Event-Related Potential-based Brain-Computer Interface

被引:0
|
作者
Goel, Mohit Kumar [1 ]
Chavarriaga, Ricardo [1 ]
Millan, Jose del R. [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Sch Engn, Ctr Neuroprosthet, Defitech Chair Non Invas Brain Machine Interface, CH-1015 Lausanne, Switzerland
关键词
MODEL;
D O I
暂无
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
In this paper we use the cortical current density based inverse solution to classify Event Related Potentials, in particular for error-related potentials elicited during a Brain-Computer Interface experiment. We selected discriminant cortical sources for comparing classification performance with respect to surface EEG. We found that the data from estimated cortical sources achieves higher classification accuracy for most of the subjects. In addition, the inverse method exhibits consistently discriminant activity for the sources located over the anterior cingulate cortex region for different time points. This level of neurophysiological interpretation in terms of localisation of selected cortical sources is enabled with the use of inverse solution.
引用
收藏
页码:430 / 433
页数:4
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