Twin-image elimination using quadrantal masks in a digital holographic microscope

被引:0
|
作者
Kim, Moonseok [1 ]
Hong, Sukjoon [1 ]
Shim, Seongbo [1 ]
Soh, Kwangsup [1 ]
Yu, Younghun [2 ]
Shin, Sanghoon [3 ]
Kim, Jaewan [4 ]
Kim, Jaisoon [4 ]
机构
[1] Seoul Natl Univ, Dept Phys & Astron, Seoul 151747, South Korea
[2] Jeju Natl Univ, Dept Phys, Cheju 690756, South Korea
[3] Alpha Profess Person & Technol Inc, Taejon 302831, South Korea
[4] Myongji Univ, Dept Phys, Yongin 449728, Gyeonggi Do, South Korea
关键词
holography; microscope; digital recording; three dimension; phase measurement; phase contrast; NUMERICAL RECONSTRUCTION; PHASE RETRIEVAL; COMPENSATION; OBJECTS;
D O I
10.1117/1.3537970
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Holography has a considerable advantage of retrieving three-dimensional information of an object from only one interference recording. However, twin images always appear in the reconstruction for the reason of symmetry. Especially, twin images significantly deteriorate the quality of the reconstructed information in on-axis configuration. A solution of the twin-image problem in a digital holographic microscope by using symmetry with quadrantal masks is suggested in this study. This method is effective to most of the measured area without any additional implements, and restrictions on sample or iterations, and is demonstrated by the simulation and experimental results. The ratio of the disturbed area by a twin-image to the total measured area is reduced to the value of 0.82% in a specific case. (c) 2011 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.3537970]
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页数:6
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