Identification of flaws using eddy current testing

被引：4
|
作者：
Sikora, R [1 ]
Chady, T [1 ]
Gratkowski, S [1 ]
Komorowski, M [1 ]
机构：
[1] Tech Univ Szczecin, Dept Elect Engn, Szczecin, Poland
来源：
COMPEL-THE INTERNATIONAL JOURNAL FOR COMPUTATION AND MATHEMATICS IN ELECTRICAL AND ELECTRONIC ENGINEERING | 1998年 / 17卷 / 04期
关键词：
artificial neural networks; eddy current; flaw detection; inverse problems;
D O I：
10.1108/03321649810210802
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
The eddy current method of non-destructive testing uses an alternating current excitation to induce secondary currents in a specimen under test. Flaws within the specimen affect the induced currents, causing changes in the impedance of a test coil. In this paper we present a method for obtaining a solution of inverse problems, in which the parameters of defects are unknown and the excitation function and the eddy current system response are given. The method is based on the use of artificial neural networks, which are trained using measurements. Illustrative examples are given.
引用
收藏
页码：516 / +
页数：13
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