The impact of fabrication errors on a flat-top grating-based planar waveguide demultiplexer

被引:0
|
作者
Lin, Chun-Ting [1 ]
Huang, Yang-Tung
Huang, Jung-Yaw
机构
[1] Natl Chiao Tung Univ, Inst Electro Opt Engn, Dept Photon, Hsinchu 30010, Taiwan
[2] Natl Chiao Tung Univ, Inst Elect, Dept Elect Engn, Hsinchu 30010, Taiwan
关键词
planar waveguide; etched diffraction grating; flat-top; crosstalk; insertion loss; phase and amplitude errors; wavelength-division multiplexing (WDM);
D O I
10.1143/JJAP.46.7356
中图分类号
O59 [应用物理学];
学科分类号
摘要
The spectral performance of a demultiplexer is significantly affected by the phase and amplitude errors due to fabrication errors. We estimate the impact of fabrication errors on a flat-top grating-based planar waveguide demultiplexer using a design example. Simulation results show that the photomask resolution resulting in a phase error should be lower than 40 nm when a crosstalk criterion of -30 dB is given. The impact of amplitude errors is not distinct until the reduced amount of the facet width is greater than 0.5 mu m and the grating side-wall angle offset from the vertical is larger than 1 degrees.
引用
收藏
页码:7356 / 7358
页数:3
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