The compositional dependence of the structural and optical properties of amorphous As20Se80-xTlx films

被引：34
|
作者：
El-Nahass, MM
Dongol, M
Abou-zied, M
El-Denglawey, A [1 ]
机构：
[1] S Valley Univ, Fac Sci, Dept Phys, Qena, Egypt
[2] Ain Shams Univ, Fac Educ, Dept Phys, Cairo, Egypt
来源：
PHYSICA B-CONDENSED MATTER | 2005年 / 368卷 / 1-4期
关键词：
optical properties; X-ray diffraction; electron microscopy; chalcogenide glasses;
D O I：
10.1016/j.physb.2005.07.014
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Thermal evaporation technique was used to deposit various samples of As20Se80-xTlx on a glass substrate where (5 <= x <= 35at%). The XRD studies were carried out for thin films of As20Se80-xTlx, where the results confirm the amorphous nature for the as-deposited films. Chemical compositions of thin films analysis were done using EDS. The optical energy gap E-g(opt) of the as-deposited films was determined from transmission and reflection spectra. The decrease of E-g(opt), with increasing Tl content was attributed to the effect of localized states. The optical constants it, k could be determined and were found to increase with the increasing of Tl-content. The dielectric constants (epsilon(omega) and epsilon(L)) were increasing with the increasing of Tl-content. Dispersion parameters were determined according to Wemple-DiDomenico relationship. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：179 / 187
页数：9
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