Fabrication of multi-bit crossbar circuits at sub-50 nm half-pitch by using UV-based nanoimprint lithography

被引:0
|
作者
Jung, GY
Wu, W
Lee, H
Wang, SY
Tong, WM
Williams, RS
机构
[1] Hewlett Packard Labs, Palo Alto, CA 94304 USA
[2] Korea Univ, Div Mat Sci & Engn, Seoul 136701, South Korea
[3] Hewlett Packard Corp, Corvallis, OR 97330 USA
关键词
nanoimprint; lithography; drop method; crossbar; UV process;
D O I
暂无
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Nanoimprinting lithography was initiated as an alternative way to achieve nanoscale structures with high throughput and low cost. We have developed a UV-nanoimprint process to fabricate 34x34 crossbar circuits at 50 nm half-pitch (equivalent to a bit density of 10 Gbit/cm(2)) with single-layer structure. We devised a technique that exploits the opposite free energies of the mold and substrate surfaces to produce a very uniform resist film without any trap air. As the pitch size decreases, lift-off process with single-layer structure was difficult to define metal wires. Sixty-six by sixty-six crossbar structures with a half-pitch of 30 nm (equivalent to a bit density of 30 Gbit/cm(2)) were produced with bi-layer structure.
引用
收藏
页码:565 / 570
页数:6
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