Postdetection switch-and-stay combining in Nakagami-m fading

被引:0
|
作者
Haghani, S [1 ]
Beaulieu, NC [1 ]
机构
[1] Univ Alberta, Dept Elect & Comp Engn, Edmonton, AB T6G 2V4, Canada
关键词
D O I
暂无
中图分类号
TN [电子技术、通信技术];
学科分类号
0809 ;
摘要
In two recent papers, the performances of dual branch postdetection switch-and-stay combining (SSC) for noncoherent binary orthogonal frequency-shift keying (BFSK) and noncuherent M-ary orthogonal frequency-shift keying (MFSK) operating in the present of show that fading modeled by Rayleigh. Nakagami-m. and Rician distributions have been analyzed. This paper shows that the previous analyses of BFSK and MFSK with postdetection SSC in Nakagami-m fading, which was limited to integer values of m. are incorrect and we drive correct bit error rate performance results for BFSK and MFSK with dual-branch SSC in Nakagami-m fading for all values of m. Our analytical results are verified using extensive Monte Carlo simulations. It is shown that for a given bit error rate the performance gain of postdetection SSC over predetection SSC has been overestimated by several dBs in SNR in previous reported work.
引用
收藏
页码:1781 / 1785
页数:5
相关论文
共 50 条