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- [7] Formation and dielectric properties of nanolayers of tantalum and aluminum oxides Ezhovskii, Yu.K. (office@tu.spb.ru), 1600, Maik Nauka Publishing / Springer SBM (43): : 42 - 48
- [8] STRUCTURAL AND ELECTRICAL CHARACTERIZATION OF SINTERED SnTe FILMS CHALCOGENIDE LETTERS, 2010, 7 (03): : 197 - 202
- [10] Structure, composition and dielectric characterization of tantalum peroxide film Rengong Jingti Xuebao/Journal of Synthetic Crystals, 2008, 37 (03): : 684 - 688