Automatic Detection of Internal defects in Solar Cells

被引：0

作者：

Lin, Wu-Ja ^{[1
]}

Lei, Yu-Hsien ^{[1
]}

Huang, Chih-Hsien ^{[1
]}

机构：

[1] Natl Formosa Univ, Dept Comp Sci & Informat Engn, Yunlin Cty, Taiwan

来源：

2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) | 2011年

关键词：

solar cell; internal crack; automatic inspection; image processing; CRACK DETECTION; SILICON;

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this manuscript, a system which automatically detects internal defects in solar cell is proposed. The proposed system applies a bias flow to the solar cell, captures emissions of solar cell, and processes captured image to recognize the internal defects of the solar cell. The experimental results show that the proposed system can successfully detect the internal defect of solar cell which can not be found by visual inspection.

引用

页码：182 / 185

页数：4

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