On chip ESD protection for 100nm to 200nm CMOS devices

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作者：
Neale, R
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来源：
ELECTRONIC ENGINEERING | 2001年 / 73卷 / 889期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：13 / 14
页数：2
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