AFM, TEM and nanoindentation characterizations of plastic deformation in metallic multilayers

被引:1
|
作者
Verdier, M [1 ]
机构
[1] CNRS, INPG, St Martin Dheres, France
关键词
D O I
10.1051/metal:2003223
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
This communication presents experimental observations of plastic deformation in submicronic metallic multilayers. As the length scale decreases down to the nanometer range, we evidence a major change in deformation mechanisms, plasticity becoming less localized as in traditional slip bands of dislocations. AFM and nanoindentation techniques are used in conjonction with more standard techniques to characterize plastic deformation.
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页码:535 / +
页数:7
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