σ-π molecular dielectric multilayers for low-voltage organic thin-film transistors

被引:243
|
作者
Yoon, MH
Facchetti, A
Marks, TJ
机构
[1] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA
[2] Northwestern Univ, Ctr Mat Res, Evanston, IL 60208 USA
关键词
gate insulator; molecular multilayer; organic dielectric; self-assembly;
D O I
10.1073/pnas.0501027102
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Very thin (2.3-5.5 nm) self -assembled organic dielectric multi layers have been integrated into organic thin-film transistor structures to achieve sub-1-V operating characteristics. These new dielectrics are fabricated by means of layer-by-layer solution phase deposition of molecular silicon precursors, resulting in smooth, nanostructurally well defined, strongly adherent, thermally stable, virtually pinhole-free, organosiloxane thin films having exceptionally large electrical capacitances (up to approximate to 2,500 nF center dot cm(-2)), excellent insulating properties (leakage current densities as low as 10(-9) A center dot cm(-2)), and single-layer dielectric constant (k) of approximate to 16. These 3D self-assembled multilayers enable organic thin-film transistor function at very low source-drain, gate, and threshold voltages (<1 V) and are compatible with a broad variety of vapor- or solution-deposited p- and n-channel organic semiconductors.
引用
收藏
页码:4678 / 4682
页数:5
相关论文
共 50 条
  • [1] Low-voltage organic thin-film transistors with π-σ-phosphonic acid molecular dielectric monolayers
    Ma, Hong
    Acton, Orb
    Ting, Guy
    Ka, Jae Won
    Yip, Hin-Lap
    Tucker, Neil
    Schofield, Richard
    Jen, Alex K. -Y.
    [J]. APPLIED PHYSICS LETTERS, 2008, 92 (11)
  • [2] Threshold Voltage Tuning of Low-Voltage Organic Thin-Film Transistors
    Shang, Liwei
    Ji, Zhuoyu
    Wang, Hong
    Chen, Yingpin
    Lu, Congyan
    Liu, Xin
    Han, Maixing
    Liu, Ming
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2011, 58 (07) : 2127 - 2134
  • [3] Low-voltage organic thin-film transistors with large transconductance
    Klauk, Hagen
    Zschieschang, Ute
    Halik, Marcus
    [J]. JOURNAL OF APPLIED PHYSICS, 2007, 102 (07)
  • [4] Manufacturing and Characteristics of Low-Voltage Organic Thin-Film Transistors
    Klauk, Hagen
    Zschieschang, Ute
    [J]. 2010 IEEE AND ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2010, : 493 - 495
  • [5] Bias stress effect in low-voltage organic thin-film transistors
    Ute Zschieschang
    R. Thomas Weitz
    Klaus Kern
    Hagen Klauk
    [J]. Applied Physics A, 2009, 95 : 139 - 145
  • [6] Bias stress effect in low-voltage organic thin-film transistors
    Zschieschang, Ute
    Weitz, R. Thomas
    Kern, Klaus
    Klauk, Hagen
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2009, 95 (01): : 139 - 145
  • [7] Megahertz operation of flexible low-voltage organic thin-film transistors
    Zschieschang, Ute
    Hofmockel, Robert
    Roedel, Reinhold
    Kraft, Ulrike
    Kang, Myeong Jin
    Takimiya, Kazuo
    Zaki, Tarek
    Letzkus, Florian
    Butschke, Joerg
    Richter, Harald
    Burghartz, Joachim N.
    Klauk, Hagen
    [J]. ORGANIC ELECTRONICS, 2013, 14 (06) : 1516 - 1520
  • [8] Low-voltage organic thin-film transistors with polymeric nanocomposite dielectrics
    Chen, Fang-Chung
    Chuang, Chiao-Shun
    Lin, Yung-Sheng
    Kung, Li-Jen
    Chen, Tung-Hsien
    Shieh, Han-Ping D.
    [J]. ORGANIC ELECTRONICS, 2006, 7 (05) : 435 - 439
  • [9] Low-voltage organic thin-film transistors based on [n] phenacenes
    Al Ruzaiqi, Afra
    Okamoto, Hideki
    Kubozono, Yoshihiro
    Zschieschang, Ute
    Klauk, Hagen
    Baran, Peter
    Gleskova, Helena
    [J]. ORGANIC ELECTRONICS, 2019, 73 : 286 - 291
  • [10] Space Environment Effects on Flexible, Low-Voltage Organic Thin-Film Transistors
    Basirico, Laura
    Basile, Alberto Francesco
    Cosseddu, Piero
    Gerardin, Simone
    Cramer, Tobias
    Bagatin, Marta
    Ciavatti, Andrea
    Paccagnella, Alessandro
    Bonfiglio, Annalisa
    Fraboni, Beatrice
    [J]. ACS APPLIED MATERIALS & INTERFACES, 2017, 9 (40) : 35150 - 35158