High speed full cross direction profile measurement and control for the paper machine wet end

被引：0

作者：

Vyse, R ^{[1
]}

Hagart-Alexander, C ^{[1
]}

Heaven, M ^{[1
]}

Steele, T ^{[1
]}

Chase, L ^{[1
]}

Goss, J ^{[1
]}

Preston, J ^{[1
]}

机构：

[1] Honeywell Measurex Devron Inc, N Vancouver, BC V7J 3S4, Canada

来源：

52ND APPITA ANNUAL GENERAL CONFERENCE, 1998 PROCEEDINGS, VOLS 1 AND 2 | 1998年

关键词：

D O I：

暂无

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

Until recently most machine direction (MD) and cross direction (CD) control systems have relied on measurements from scanners of file dry end of the paper machine. As a result, control is significantly delayed on all machines. On multiply machines, it has not been possible to control the MD or CD weight of the individual plies. This payer reports on a new under-the-wire wafer weight sensor that allows rapid determination of MD and CD variation at the wet end of the paper machine. Case studies from mills using this new technology will be presented and discussed.

引用

页码：435 / 441

页数：7

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