The influence of X-ray resonant Raman scattering effects on the detection of copper(II) tetrasulphonated phthalocyanine (CuTSPc) thin-films. deposited on gold electrodes

被引：1
|
作者：
Peeters, Karl [1 ]
De Wael, Karolien [1 ]
Adniaens, Annemie [1 ]
Falkenberg, Gerald [2 ]
Vincze, Laszlo [1 ]
机构：
[1] Univ Ghent, Dept Analyt Chem, B-9000 Ghent, Belgium
[2] DESY, Hamburger Synchrotronstrahlungslabor Deutsches El, D-22607 Hamburg, Germany
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2008年 / 63卷 / 03期
关键词：
X-ray resonant Raman scattering (XRRS); detection limit; copper(H) tetrasulphonated phthalocyanine (CuTSPc); gold electrode; synchrotron radiation; X-ray fluorescence (XRF);
D O I：
10.1016/j.sab.2007.12.004
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The influence of X-ray resonant Raman scattering on the detection capabilities of copper(II) tetrasulphonated phthalocyanine (CuTSPc) thinfilms on gold electrodes has been investigated by means of synchrotron radiation X-ray fluorescence. In particular the paper focuses on the influence of the excitation energy in the relative narrow energy region of 9.2 to 11.7 keV on the detection limits and the peak-to-background ratios of copper. (c) 2007 Elsevier B.V All rights reserved.
引用
收藏
页码：450 / 454
页数：5
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