Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion

被引：0
|
作者：
Ikeda, Kosuke [1 ]
Schaub, Keith [2 ]
Leventhal, Ira [3 ]
Makris, Yiorgos [4 ]
Xanthopoulos, Constantinos [4 ]
Neethirajan, Deepika [4 ]
机构：
[1] Appl Res & Technol Japan, Tokyo, Japan
[2] Advantest Amer Inc, Appl Res & Technol, Austin, TX USA
[3] Advantest Amer Inc, Appl Res & Technol, San Jose, CA USA
[4] Univ Texas Dallas, Comp Sci Dept, Dallas, TX USA
来源：
2019 IEEE INTERNATIONAL TEST CONFERENCE (ITC) | 2019年
关键词：
D O I：
10.1109/itc44170.2019.9000126
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页数：3
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