Anisotropic oxidation of MoS2 crystallites studied by angle-resolved X-ray photoelectron spectroscopy

被引:0
|
作者
Lince, JR [1 ]
Frantz, PP [1 ]
机构
[1] Aerospace Corp, Space Mat Lab, El Segundo, CA 90245 USA
关键词
solid lubrication; X-ray photoelectron spectroscopy; surface chemistry; slip rings; molybdenum disulfide; wear; electrical noise;
D O I
暂无
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
The oxidation behavior of the solid lubricant MoS2 was studied using X-ray photoelectron spectroscopy. MoS2-containing slip ring brushes were used to take advantage of anisotropic orientation of the plate-shaped MoS2 crystallites occurring during fabrication of the brushes. Because oxidation occurs preferentially at the edges of the crystallites. greater oxidation fractions are measured when the edges are oriented toward the photoelectron energy analyzer. These results indicate a novel method for separately probing the chemistry on the edge and (lubricious) basal surfaces of MoS2.
引用
收藏
页码:211 / 218
页数:8
相关论文
共 50 条
  • [1] Anisotropic oxidation of MoS2 crystallites studied by angle-resolved X-ray photoelectron spectroscopy
    Lince J.R.
    Frantz P.P.
    Tribology Letters, 2001, 9 (3-4) : 211 - 218
  • [2] Angle-resolved X-ray photoelectron spectroscopy of in situ deposited Li on MoS2(0002)
    Park, KT
    Kong, J
    Klier, K
    JOURNAL OF PHYSICAL CHEMISTRY B, 2000, 104 (14): : 3145 - 3154
  • [3] ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY
    FADLEY, CS
    PROGRESS IN SURFACE SCIENCE, 1984, 16 (03) : 275 - 388
  • [4] Valence-band electronic structure of MoS2 and Cs/MoS2(0002) studied by angle-resolved x-ray photoemission spectroscopy
    Park, KT
    RichardsBabb, M
    Hess, JS
    Weiss, J
    Klier, K
    PHYSICAL REVIEW B, 1996, 54 (08): : 5471 - 5479
  • [5] NITRIDATION OF POLYCRYSTALLINE TITANIUM AS STUDIED BY INSITU ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY
    ERMOLIEFF, A
    BERNARD, P
    MARTHON, S
    WITTMER, P
    SURFACE AND INTERFACE ANALYSIS, 1988, 11 (11) : 563 - 568
  • [6] Anisotropic electronic structure of NaAlSi studied by angle-resolved soft x-ray emission spectroscopy
    Ebisu, Ryogo
    Sato, Yohei K.
    Yamada, Takahiro
    Terauchi, Masami
    JOURNAL OF APPLIED PHYSICS, 2023, 134 (21)
  • [7] Simulation of parallel angle-resolved X-ray photoelectron spectroscopy data
    Tasneem, G.
    Werner, W. S. M.
    Smekal, W.
    Powell, C. J.
    SURFACE AND INTERFACE ANALYSIS, 2010, 42 (6-7) : 1072 - 1075
  • [8] A THEORY OF QUANTITATIVE ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY
    TILININ, IS
    JABLONSKI, A
    LESIAKORLOWSKA, B
    VACUUM, 1995, 46 (5-6) : 613 - 616
  • [9] FOCUSING AND DIFFRACTION EFFECTS IN ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY
    POON, HC
    TONG, SY
    PHYSICAL REVIEW B, 1984, 30 (10): : 6211 - 6213
  • [10] Thermal oxidation of outdiffusing SiO with permeating O-2 in a SiO2 film studied by angle-resolved X-ray photoelectron spectroscopy
    Takakuwa, Y
    Nihei, M
    Miyamoto, N
    APPLIED SURFACE SCIENCE, 1997, 117 : 141 - 146