Nanoscale patterning of metallic and organic features on semiconductors.

被引：0
|
作者：
Buriak, J
Aizawa, M
Qiao, YH
机构：
[1] Univ Alberta, Dept Chem, Edmonton, AB T6G 2G2, Canada
[2] Natl Inst Nanotechnol, Edmonton, AB T6G 2G2, Canada
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2005年 / 229卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
096-COLL
引用
收藏
页码：U644 / U644
页数：1
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