Microstructure imaging of the YBCO thin film MgO substrate interface: HRTEM and Fourier analysis of the Moire fringe pattern

被引：9
|
作者：
Auzary, S [1 ]
Pailloux, F [1 ]
Denanot, MF [1 ]
Gaboriaud, RJ [1 ]
机构：
[1] Univ Poitiers, Met Phys Lab, UMR 6630, CNRS,SP2MI, F-86960 Futuroscope, France
来源：
THIN SOLID FILMS | 1998年 / 319卷 / 1-2期
关键词：
Fourier analysis; MgO substrate; HRTEM;
D O I：
10.1016/S0040-6090(97)01114-0
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Detailed microstructural aspects of the interface between YBaCuO thin films and MgO substrate are studied by means of a Fourier analysis of Moire fringe pattern obtained from HRTEM investigations of plan view samples. The main features of the observations are large, well oriented crystallographic domains surrounded by wide boundaries. HRTEM investigations together with the Fourier analysis show evidence of both orthorhombic and pseudo-tetragonal structure in the YBaCuO film. An accommodation mechanism is suggested from the Fourier analysis of the Moire fringe pattern. (C) 1998 Published by Elsevier Science S.A.
引用
收藏
页码：163 / 167
页数：5
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