Study on the application of multi-frequency error test

被引：0
|
作者：
He, Xiaojun [1 ]
Tian, Xiaoping [2 ]
Dai, Bo [2 ]
机构：
[1] Beijing Univ Chem Technol, Beijing 102617, Peoples R China
[2] Profess Beijing Inst Petrochem, Beijing 102617, Peoples R China
来源：
MATERIALS SCIENCE AND INFORMATION TECHNOLOGY, PTS 1-8 | 2012年 / 433-440卷
关键词：
BER test; m-Sequences; telephone line; Modem chip;
D O I：
10.4028/www.scientific.net/AMR.433-440.4802
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
In order to test the characteristics of the telephone line, BER (Bit Error Rate) test is one of the most important aspects. The multi-frequency BER test is achieved using FPGA (Field Programmable Gate Array), MCU (Micro Controller Unit) and Modem chip. This design is able to exactly test the telephone line's bit error whose frequency is between 1.2KHz and 160KHz. repeatedly experiments results show that this method is stable and reliable, and has important application values.
引用
收藏
页码：4802 / +
页数：2
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